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Scanning Electron Microscopy and X-Ray Microana...
79,99 € *
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This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners - engineers, technicians, physical and biological scientists, clinicians, and technical managers - will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope's software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD). With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal. Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managers Emphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful results Provides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurements Makes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation. Includes case studies to illustrate practical problem solving Covers Helium ion scanning microscopy Organized into relatively self-contained modules - no need to "read it all" to understand a topic Includes

Anbieter: buecher
Stand: 28.05.2020
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IFRS - FINANCIAL CONSOLIDATION WITH SAP SEM-BCS
96,00 € *
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The Consolidation Consolidation concept describes the BW model based on the procedure model for the implementation of the SAP SEM BCS software for a globally operating industrial group.The focus of the analysis is the technical implementation of the requirements for mapping the IFRS consolidated financial statements using SAP standard software. SEM-BCS 6.00.This IT design contains the technical specifications of the technical requirements. The application design was divided into the main topics data model, master data, measures, methods, reporting and interfaces. In addition to this main document, there are some technical details in the appendix, as well as the corresponding references.This paper is to be used as a handbook for the SEM-BCS Introduction. The aim of this manual is to introduce the SEM-BCS with its individual steps, starting with the BCS activation from the business content, building up, defining the data model in BW, as well as selecting, defining and customizing the consolidation measures and Display methods by example settings.Likewise, the "initial technical consolidation, balance sheet consolidation, download with data stream and also the technique" purchase price distribution "(PPA) are discussed in detail.

Anbieter: Dodax
Stand: 28.05.2020
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Scanning Electron Microscopy and X-Ray Microana...
92,67 € *
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This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners - engineers, technicians, physical and biological scientists, clinicians, and technical managers - will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope's software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD). With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal. Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managersEmphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful resultsProvides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurementsMakes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation.Includes case studies to illustrate practical problem solvingCovers Helium ion scanning microscopyOrganized into relatively self-contained modules - no need to "read it all" to understand a topicIncludes

Anbieter: Dodax
Stand: 28.05.2020
Zum Angebot
Scanning Electron Microscopy and X-Ray Microana...
139,78 € *
ggf. zzgl. Versand

This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners - engineers, technicians, physical and biological scientists, clinicians, and technical managers - will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope's software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD). With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal. Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managersEmphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful resultsProvides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurementsMakes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation.Includes case studies to illustrate practical problem solvingCovers Helium ion scanning microscopyOrganized into relatively self-contained modules - no need to "read it all" to understand a topicIncludes

Anbieter: Dodax
Stand: 28.05.2020
Zum Angebot
Scanning Electron Microscopy and X-Ray Microana...
96,90 CHF *
ggf. zzgl. Versand

This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners — engineers, technicians, physical and biological scientists, clinicians, and technical managers — will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope’s software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD). With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a 'dual beam' platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal. Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managers Emphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful results Provides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurements Makes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation. Includes case studies to illustrate practical problem solving Covers Helium ion scanning microscopy Organized into relatively self-contained modules – no need to 'read it all' to understand a topic Includes an online supplement—an extensive 'Database of Electron–Solid Interactions'—which can be accessed on SpringerLink, in Chapter 3

Anbieter: Orell Fuessli CH
Stand: 28.05.2020
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Introduction to Structural Equation Modeling Us...
82,90 CHF *
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This student orientated guide to structural equation modeling promotes theoretical understanding and inspires students with the confidence to successfully apply SEM. Assuming no previous experience, and a minimum of mathematical knowledge, this is an invaluable companion for students taking introductory SEM courses in any discipline. Niels Blunch shines a light on each step of the structural equation modeling process, providing a detailed introduction to SPSS and EQS with a focus on EQS' excellent graphical interface. He also sets out best practice for data entry and programming, and uses real life data to show how SEM is applied in research. The book includes: Learning objectives, key concepts and questions for further discussion in each chapter. Helpful diagrams and screenshots to expand on concepts covered in the texts. A wide variety of examples from multiple disciplines and real world contexts. Exercises for each chapter on an accompanying . A detailed glossary. Clear, engaging and built around key software, this is an ideal introduction for anyone new to SEM.

Anbieter: Orell Fuessli CH
Stand: 28.05.2020
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Principles and Practice of Structural Equation ...
117,00 CHF *
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'Kline is a master at explaining complex concepts in a very accessible manner. It is refreshing to see a new edition of an important book that truly is new, not simply redesigned. The fourth edition successfully incorporates recent developments in SEM and contemporary forms of causal reasoning and analysis, such as the SCM. Unlike most SEM texts, this book is notable for making a sophisticated, often-difficult statistical technique understandable to non-statisticians without watering down the material. Kline makes excellent use of relevant statistical theory without overwhelming the reader with algebraic matrices, proofs, formulas, and statistical notations. I recommend this book without reservation to researchers, instructors, and students in the social and behavioral sciences. It is far more than an introduction to SEM--in my opinion, it is a potential catalyst for reconsidering the statistical methods that researchers apply to better understand human action and interaction.'--Chris L. S. Coryn, PhD, Director, Interdisciplinary PhD in Evaluation, Western Michigan University'Too often, new editions of statistics books do not have substantive changes, but that is not the case here--Kline has made significant improvements to an already excellent book. Staying current is particularly necessary in SEM, where the theory has been developing rapidly in the last 10 years, yielding, for example, better estimation methods for categorical data and Bayesian methods. Helpful features include the topic boxes, which allow detailed discussion of particular topics without interfering with the overall flow of the text. I also like the exercises at the end of each chapter, which highlight the important parts of the chapter and provide crucial learning opportunities. Kline’s use of the companion website to distribute real examples is excellent. After reading about the models and analyses, it is helpful--actually vital--to be able to practice running the models in various software packages.'--Craig S. Wells, PhD, Department of Educational Policy, Research, and Administration, University of Massachusetts Amherst'The best place to start for anyone who wants to learn the basics of SEM. The text emphasizes applied SEM content without relying on statistical formulas and the writing is clear and well organized, which is very helpful for students. I appreciate having exercises with answers that students can complete and check on their own. The examples are very helpful, and reflect the fact that real data are often troublesome. The website is easy to use and more extensive than for many other books.'--Donna Harrington, PhD, University of Maryland School of Social Work'The incorporation of Pearl’s approach to causal inference is a major improvement in the fourth edition. This is the most useful introductory SEM book out there. I have recommended this book to colleagues for both personal and class use, and will continue to do so.'--Richard K. Wagner, PhD, Distinguished Professor of Psychology, Florida State University; Associate Director, Florida Center for Reading Research'This book is unique in that it treats structural equation models for what they are--carriers of causal assumptions and tools for causal inference. Gone are the inhibitions and trepidation that characterize most SEM texts in their treatments of causal inference. Overall, the book elevates SEM education to a new level of modernity and promises to usher in a renaissance for a field that pioneered causal analysis in the behavioral sciences.'--Judea Pearl, PhD, Department of Computer Science, University of California, Los Angeles 'Perfectly addresses the needs of social scientists like me without formal training in mathematical statistics....Can be read by any graduate in psychology or even by keen undergraduates interested in exploring new vistas. Yet it will also constitute a surprisingly good read for experienced researchers in search of some refreshing insights in their favorite techniques....A real tour de force....Succeeds in reconciling comprehensiveness and comprehensibility.'--The Psychologist (on the second edition) 'The greatest strength of this book is Kline's ability to present materials in an engaging, accessible manner. In nearly all situations

Anbieter: Orell Fuessli CH
Stand: 28.05.2020
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Structural Equation Modeling for Social and Per...
66,90 CHF *
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Electronic Inspection Copy available Structural Equation Modeling offers a nontechnical presentation of SEM with an emphasis on applications in social and personality psychology. The presentation begins with a discussion of the relation between SEM and statistical strategies widely used in social and personality psychology such as analysis of variance, multiple regression analysis, and factor analysis. This introduction is followed by a nontechnical presentation of the terminology, notation, and steps followed in a typical application of SEM. The reminder of the volume offers a practically-oriented presentation of specific applications using examples typical of social and personality psychology and offering advice for dealing with relevant issues such as missing data, choice of software, and best practices for interpreting and reporting results. The SAGE Library in Social and Personality Psychology Methods provides students and researchers with an understanding of the methods and techniques essential to conducting cutting-edge research. Each volume within the Library explains a specific topic and has been written by an active scholar (or scholars) with expertise in that particular methodological domain. Assuming no prior knowledge of the topic, the volumes are clear and accessible for all readers. In each volume, a topic is introduced, applications are discussed, and readers are led step by step through worked examples. In addition, advice about how to interpret and prepare results for publication are presented.

Anbieter: Orell Fuessli CH
Stand: 28.05.2020
Zum Angebot
Introduction to Structural Equation Modeling Us...
50,90 CHF *
ggf. zzgl. Versand

This student orientated guide to structural equation modeling promotes theoretical understanding and inspires students with the confidence to successfully apply SEM. Assuming no previous experience, and a minimum of mathematical knowledge, this is an invaluable companion for students taking introductory SEM courses in any discipline. Niels Blunch shines a light on each step of the structural equation modeling process, providing a detailed introduction to SPSS and EQS with a focus on EQS' excellent graphical interface. He also sets out best practice for data entry and programming, and uses real life data to show how SEM is applied in research. The book includes: Learning objectives, key concepts and questions for further discussion in each chapter. Helpful diagrams and screenshots to expand on concepts covered in the texts. A wide variety of examples from multiple disciplines and real world contexts. Exercises for each chapter on an accompanying . A detailed glossary. Clear, engaging and built around key software, this is an ideal introduction for anyone new to SEM.

Anbieter: Orell Fuessli CH
Stand: 28.05.2020
Zum Angebot