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Scanning Electron Microscopy and X-Ray Microana...
79,99 € *
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This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners - engineers, technicians, physical and biological scientists, clinicians, and technical managers - will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope's software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD). With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal. Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managersEmphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful resultsProvides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurementsMakes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation.Includes case studies to illustrate practical problem solvingCovers Helium ion scanning microscopyOrganized into relatively self-contained modules - no need to "read it all" to understand a topicIncludes

Anbieter: buecher
Stand: 28.01.2021
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Machining of Inconel625 Flat Surfaces With Mult...
39,90 € *
ggf. zzgl. Versand

With progressions in technological advancements, new materials are being developed to meet industrial requirements. One such Nickel based super alloy is Inconel 625. Inconel 625 exhibits extraordinary mechanical properties along with chemical stability at high temperature. Due to extraordinary mechanical, physical and chemical properties, Inconel 625 is exceptionally hard to machine/finish. In this book, magnetic abrasive finishing process has been proposed to finish flat Inconel 625 surfaces. Three different parameters processing time, pole rotational speed and weight percentage of abrasives and their range has been selected. Design expert software has been used to plan experiments. Seventeen experiments were conducted as per experimental plan. The effect of process parameters on output characteristics (Percentage improvement in surface finish and Material removed) has been analyzed. Microscopic analysis and SEM analysis of few work pieces has been also provided to analyze the effect of process parameters.

Anbieter: Dodax
Stand: 28.01.2021
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Optimization of Process Parameters of Powder Mi...
39,99 € *
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Bachelor Thesis from the year 2017 in the subject Engineering - General, Basics, , course: Mechanical Engineering, language: English, abstract: Electric Discharge Machining is mainly used for very hard materials. Now a days we know that product and process technology is very advance, many types of new materials are being developed which have very high strength, high thermal and electrical conductivity which are difficult to machine by traditional machining methods. So Non-conventional machining methods are used to machine such type of materials, EDM is also one of the Non-conventional machining methods which is used to machine such advance hard and brittle materials to satisfy the present days product needs like aerospace, mould, dies and other applications. Mixing of powders into dielectric fluid is a one of the recent advancement in the EDM process to improve its process capabilities and is known as Powder Mixed Electric Discharge Machining (PMEDM) process. The objective of this work is mainly to study the effect of various input parameters like pulse-on-time, discharge current, tool material and grit size on the various output parameters like MRR, TWR, Surface Roughness, Hole Diameter Variation and Micro structure. In this study, these output parameters are studied by using the ANOVA through Minitab17 software. By using this software, study the Means and S/N ratios for all these parameters. Optimization of the whole process through Grey Relational Analysis for obtains the better output response simultaneously. Improvement in output responses by using grey relational analysis are 64.84% in TWR, 52% in HDV, 49.78% in MRR and 41.57% in SR. Micro structure has been also observed through SEM analysis.

Anbieter: Dodax
Stand: 28.01.2021
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Magnetic Nanowires
79,00 € *
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Magnetic nanostructures have attracted increasing attention because of their potential applications in high-density data storage and in sensor technology. An understanding of the fundamental physical properties of these nanostructures is of interest in the study of atomic structures and micromagnetism. This book presents a study on the growth of nickel nanowires in commercially available templates. Electrodeposition was used through the pores of a template to produce nanowire matrices. Dependence of the nanowire growth rate, quality of deposit, growth uniformity, crystal orientations and other physical properties of the nanowire network were studied using various process parameters. Structural properties of the nanowire were characterised using AFM, SEM, EDX and TEM. Magnetic properties of the nanowires were studied using a VSM and MFM. Using OOMMF software magnetic behaviour of the nanowires was simulated and compared with the experimental coercivity values and magnetisation behaviour. The target audience of this book is the postgraduate students and the researchers who would like to study the fabrication and characterisation of magnetic nanowires.

Anbieter: Dodax
Stand: 28.01.2021
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Heat and Mass Transfer in Urea Prilling Process
49,00 € *
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Urea prills are produced in the prilling tower, where a cooling-solidification-cooling process of the prills takes place. The ambient air is used as the cooling stream for this process. A case study of the urea prilling process is chosen due to in hot/humid days, the temperature of the product at the bottom of the prilling tower is hot and cannot be packed directly. In addition, the urea prills form lumps and cakes with each other on the scrubber at the bottom of the prilling tower that affects the quality of the product. A mathematical model based on the particle kinematics,and, heat and mass transfer between the urea prills and the cooling air is developed. This is followed by using a numerical technique with an explicit scheme to solve the model. The model numerical results are validated with Scanning Electronic Microscope (SEM) observation of urea particles. Moreover,to investigate the effect of the urea prilling tower configuration parameters on the above urea product problems, the hydrodynamic of air flow inside the tower is analyzed using Computational Fluid Dynamics (CFD) simulation software.

Anbieter: Dodax
Stand: 28.01.2021
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Investigation of Heavy Metals Removal from Cont...
49,90 € *
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In present study, Light weight Expanded Clay Aggregate (LECA) coated with iron (Fe) oxide has been explored as a green and low cost sorbent to remove Ni (II) from polluted water. Iron Oxide Coated LECA (IOCL) as a new sorbent was examined for its efficiency as Ni (II) sorbent by change the operational parameters, such as contact time, initial pH of the solutions, sorbent dosages and initial Ni (II) concentration in batch systems. Also the adsorption characteristics of Natural LECA (NL) and IOCL were examined trough X-ray Fluorescence Spectroscopy (XRF), Scanning Electron Microscopy (SEM), X-ray Diffraction (XRD) and Fourier Transform Infrared (FTIR) spectroscopy analysis. Results revealed that modified sorbent have a rougher surface with holes and cave type opening on the surface, which state high porosity and favorable surface area for adsorption process. The surface area increased due to coating process. The results obtained from Design-Expert software indicate that a IOCL dosage of 5.0 g.L-1, initial solution pH of 6.2 and initial Ni (II) concentration of 50.0 mg.L-1 in contact time of 2 h, has the optimum condition for removal of Ni (II) in domain of experiments.

Anbieter: Dodax
Stand: 28.01.2021
Zum Angebot
Scanning Electron Microscopy and X-Ray Microana...
93,02 € *
ggf. zzgl. Versand

This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners - engineers, technicians, physical and biological scientists, clinicians, and technical managers - will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope's software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD). With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal. Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managersEmphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful resultsProvides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurementsMakes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation.Includes case studies to illustrate practical problem solvingCovers Helium ion scanning microscopyOrganized into relatively self-contained modules - no need to "read it all" to understand a topicIncludes

Anbieter: Dodax
Stand: 28.01.2021
Zum Angebot
SAP Business Planning and Consolidation - Guidl...
92,00 € *
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The book is aimed primarily at employees in the finance, controlling, planning and IT departments. Likewise to Business experienced IT and Business Consultant.As with most software implementations, implementing or moving to Business Process and Consolidation (BPC), an SAP application for financial planning and consolidation, requires more than just technical know-how. Although the big beneficiaries of the BPC implementation are financial planners, controllers and analysts, the success (or failure) of many other actors is influenced by the implementation of SAP BPC. It should be clear to all involved that BPC can not equate a SEM-BCS system with its professional versatility. This primarily relates to the IFRS-compliant consolidation application in the daily FAST CLOSING PROCESS in legal and management consolidation. In addition, support for the SAP application SEM-BCS is more effective than the limited support / support resources at SAP BPC.In large corporations, a combined application of SEM-BCS with BPC is performed, which is an optimal complement between actual consolidation and planning / budgeting.To what extent in the future in a cloud landscape an effective integration of the components S / 4HANA, BPC, IP and SEM-BCS respectively BOFC successfully designed the FAST CLOSING PROCESS will depend to a great extent on the know-how of the business consultant, IT colleagues, users and SAP support.This book is your comprehensive guide to setting up standard and embedded SAP BPC. Preview Real-Time Consolidation and see how to migrate to SAP BPC 10.1 to stay on the cutting edge of SAP BPC.Application examples show the handling and setting of the following functions-Implement standard and embedded SAP BPC-Set up consolidation: ownership, intercompany eliminations, journal entries.....-Standard and embedded SAP BPC-Reporting-Data loading-Forecasting, planning-Consolidation-SAP HANA-Data Manager-Migration-Real-Time Consolidation

Anbieter: Dodax
Stand: 28.01.2021
Zum Angebot
Machining of Inconel625 Flat Surfaces With Mult...
39,90 € *
ggf. zzgl. Versand

With progressions in technological advancements, new materials are being developed to meet industrial requirements. One such Nickel based super alloy is Inconel 625. Inconel 625 exhibits extraordinary mechanical properties along with chemical stability at high temperature. Due to extraordinary mechanical, physical and chemical properties, Inconel 625 is exceptionally hard to machine/finish. In this book, magnetic abrasive finishing process has been proposed to finish flat Inconel 625 surfaces. Three different parameters processing time, pole rotational speed and weight percentage of abrasives and their range has been selected. Design expert software has been used to plan experiments. Seventeen experiments were conducted as per experimental plan. The effect of process parameters on output characteristics (Percentage improvement in surface finish and Material removed) has been analyzed. Microscopic analysis and SEM analysis of few work pieces has been also provided to analyze the effect of process parameters.

Anbieter: Dodax
Stand: 28.01.2021
Zum Angebot